Marc Aoulaiche

发表

BJT-Mode Endurance on a 1T-RAM Bulk FinFET Device

Zhichao Lu, Guido Groeseneken, Marc Aoulaiche, 2010, IEEE Electron Device Letters.

Study of the main digital and analog parameters of underlappedMuGFETs

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2012 .

Two- and Three-Dimensional Fully-Depleted Extension-Less Devices for Advanced Logic and Memory Applications (Special Issue : Solid State Devices and Materials)

Anabela Veloso, Marc Aoulaiche, An De Keersgieter, 2013 .

Reliability issues inadvanced Highk/metal gatestacks for45nm CMOS applications

Guido Groeseneken, L. Pantisano, Marc Aoulaiche, 2006 .

Optimizing the front and back biases for the best sense margin and retention time in UTBOX FBRAM

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2013 .

Invited) Advanced Dielectrics Targeting 2X DRAM MIM Capacitors

Min-Soo Kim, Ben Kaczer, Marc Aoulaiche, 2013 .

Off-state stress degradation mechanism on advanced p-MOSFETs

Naoto Horiguchi, Dimitri Linten, Ben Kaczer, 2015, 2015 International Conference on IC Design & Technology (ICICDT).

Reliability and retention of floating body RAM on bulk FinFET

Eddy Simoen, Guido Groeseneken, Marc Aoulaiche, 2012 .

Impact of Off State Stress on advanced high-K metal gate NMOSFETs

Jacopo Franco, Tom Schram, Marc Aoulaiche, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors

Naoto Horiguchi, Eddy Simoen, Aaron Thean, 2013, 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2014, Microelectron. Reliab..

I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration

Naoto Horiguchi, Aaron Thean, Tom Schram, 2015, 2015 International Conference on IC Design & Technology (ICICDT).

Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs

Naoto Horiguchi, Tom Schram, Marc Aoulaiche, 2015, 2015 International Conference on IC Design & Technology (ICICDT).

Observation of the Two-Sided Read Window on UTBOX SOI 1T-DRAM: Measurement Setup, Numerical and Empirical Results

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2014 .

Overview of 3D NAND Technologies and Outlook Invited Paper

Marc Aoulaiche, Srinath Venkatesan, M. Aoulaiche, 2018, 2018 Non-Volatile Memory Technology Symposium (NVMTS).

Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications

Eddy Simoen, Marc Aoulaiche, C. Claeys, 2014 .

On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs

Anabela Veloso, Marc Aoulaiche, Cor Claeys, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Assessment of SiGe quantum well transistors for DRAM peripheral applications

Naoto Horiguchi, Y. Son, Tom Schram, 2015, 2015 International Conference on IC Design & Technology (ICICDT).

Diffusion and Gate Replacement: A New Gate-First High- $k$ /Metal Gate CMOS Integration Scheme Suppressing Gate Height Asymmetry

Naoto Horiguchi, Jerome Mitard, Eddy Simoen, 2016, IEEE Transactions on Electron Devices.

Floating body retention analysis for 1T-DRAM

Cor Claeys, Eddy Simoen, Liesbeth Witters, 2013 .

NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase

Anabela Veloso, Guido Groeseneken, Ben Kaczer, 2007, Microelectron. Reliab..

Noise analysis inadvanced memory devices

Cor Claeys, Eddy Simoen, Gino Giusi, 2015 .

Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling

Guido Groeseneken, Stefan De Gendt, Marc Aoulaiche, 2007, Microelectron. Reliab..

Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics

Guido Groeseneken, Calogero Pace, Marc Aoulaiche, 2005 .

Behavior of triple gate Bulk FinFETs with and without DTMOS operation

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2011, Ulis 2011 Ultimate Integration on Silicon.

Extensionless UTBB FDSOI Devices in Enhanced Dynamic Threshold Mode under Low Power Point of View

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2015 .

Significant reduction of Positive Bias Temperature Instability in high-k/metal-gate nFETs by incorporation of rare earth metals

Anabela Veloso, Guido Groeseneken, Ben Kaczer, 2009 .

Anomalous positive-bias temperature instability of high-κ/metal gate devices with Dy2O3 capping

Guido Groeseneken, Luigi Pantisano, Marc Aoulaiche, 2008 .

Analytical model for anomalous Positive Bias Temperature Instability in La-based HfO2 nFETs based on independent characterization of charging components

Aaron Thean, Guido Groeseneken, Ben Kaczer, 2013 .

Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities

Eddy Simoen, C. Claeys, Marc Aoulaiche, 2013 .

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2× and Beyond

Naoto Horiguchi, Wilfried Vandervorst, Tom Schram, 2014, IEEE Transactions on Electron Devices.

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

Eddy Simoen, C. Claeys, Marc Aoulaiche, 2014 .

Understanding and optimizing the floating body retention in FDSOI UTBOX

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2016 .

Low-Frequency Noise Study of p-Channel Bulk MuGFETs

Eddy Simoen, Marc Aoulaiche, Nadine Collaert, 2011 .

Channel Hot Carrier Degradation Mechanism in Long/Short Channel $n$-FinFETs

Naoto Horiguchi, Philippe Roussel, Guido Groeseneken, 2013, IEEE Transactions on Electron Devices.

Impact of Hf content on negative bias temperature instabilities in HfSiON-based gate stacks

Guido Groeseneken, Marc Aoulaiche, S. De Gendt, 2005 .

Cor Claeys, Eddy Simoen, Luo Jun, 2015 .

Impact of Si-passivation thickness and processing on NBTI reliability of Ge and SiGe pMOSFETs

Jerome Mitard, Tibor Grasser, Guido Groeseneken, 2009 .

Low-Frequency Noise Spectroscopy of Bulk and Border Traps in Nanoscale Devices

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2015 .

On the Variability of the Low-Frequency Noise in UTBOX SOI nMOSFETs

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2012 .

Lessons Learned from Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs

Eddy Simoen, C. Claeys, Marc Aoulaiche, 2013 .

Contribution of fast and slow states to Negative Bias Temperature Instabilities in HfxSi(1-x )ON/TaN based pMOSFETs

Guido Groeseneken, Marc Heyns, Marc Aoulaiche, 2005 .

Distinction between silicon and oxide traps using single-trap spectroscopy

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2015 .