P Z Takacs

Specification of surface figure and finish in terms of system performance.

E L Church, P Z Takacs, P. Takacs, 1993, Applied optics.

Development of advanced profiling instrumentation for measurement of large aspheric optical components. Final report

P Z Takacs, 1994 .

Optical constants for thin films of C, diamond, Al, Si, and CVD SIC from 24 A to 1216 A.

P Z Takacs, B Newnam, P. Takacs, 1988, Applied optics.

Improvements in the accuracy and the repeatability of long trace profiler measurements.

P Z Takacs, P. Takacs, E. Church, 1999, Applied optics.

Electroformed grazing incidence x-ray mirrors for a mirror array telescope.

P Z Takacs, G M Simnett, M P Ulmer, 1987, Applied optics.