William K. Lo

Benefits of phase interference detection to IC waveform probing

Chris Shaw, Jeffrey A. Block, William K. Lo, 2001, Proceedings 10th Asian Test Symposium.

Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing

Joy Y. Liao, Howard L. Marks, Steven Kasapi, 2009, Microelectron. Reliab..

An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits

William K. Lo, Keneth R. Wilsher, P. LeCoupanec, 2003, Microelectron. Reliab..

Optical interferometric probing of advanced microprocessors

G. Xiao, Travis M. Eiles, William K. Lo, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

Practical optical waveform probing of flip-chip CMOS devices

William K. Lo, Keneth R. Wilsher, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).