W. David Ballew

Board-level boundary scan: regaining observability with an additional IC

W. David Ballew, Lauren M. Streb, 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Elimination of incoming test based upon in-process failure and repair costs

W. David Ballew, Lauren M. Streb, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

Board-level boundary-scan: regaining observability with an additional IC

W. David Ballew, Lauren M. Streb, 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.