Frank Gennari

Pre-Tapeout Design for Yield Application: Design based Diffing, Pattern Analytics and Risk Scoring

Ya-Chieh Lai, Piyush Pathak, Philippe Hurat, 2018, 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM).

A pattern matching system for linking TCAD and EDA

Andrew R. Neureuther, Frank Gennari, 2004, International Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003. (Cat. No.03EX720).

DeePattern: Layout Pattern Generation with Transforming Convolutional Auto-Encoder

Ya-Chieh Lai, Piyush Pathak, Haoyu Yang, 2019, 2019 56th ACM/IEEE Design Automation Conference (DAC).

Detecting multi-layer layout hotspots with adaptive squish patterns

Ya-Chieh Lai, Piyush Pathak, Haoyu Yang, 2019, ASP-DAC.

DRCPlus in a router: automatic elimination of lithography hotspots using 2D pattern detection and correction

Jie Yang, Ya-Chieh Lai, Olivier Omedes, 2010, Advanced Lithography.

HW/SW partitioning and code generation of embedded control applications on a reconfigurable architecture platform

Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli, Massimo Baleani, 2002, Proceedings of the Tenth International Symposium on Hardware/Software Codesign. CODES 2002 (IEEE Cat. No.02TH8627).

Scalable interconnect and power distribution for island-style FPGAs (poster abstract)

Herman Schmit, David Whelihan, Frank Gennari, 2000, FPGA '00.

Methodology for analyzing and quantifying design style changes and complexity using topological patterns

Jason Sweis, Ya-Chieh Lai, Jason P. Cain, 2016, SPIE Advanced Lithography.

Fast, high-capacity critical area analysis (CAA) with advanced FINFET defectivity calculation

Ya-Chieh Lai, Philippe Hurat, Shobhit Malik, 2021 .