G. Bascoul

New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI

P. Perdu, S. Chef, K. Sanchez, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Optical probing (EOFM / TRI): A large set of complementary applications for ultimate VLSI

P. Perdu, S. Chef, K. Sanchez, 2013, Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).