James Prendergast

发表

Investigation of the intrinsic SiO2 area dependence using TDDB testing and model integration into the design process

John S. Suehle, James Prendergast, Nigel Foley, 1998 .

Building‐in reliability ‐ implementation and benefits

James Prendergast, Eammon Murphy, Malcom Stephenson, 1996 .

Investigation into the correct statistical distribution for oxide breakdown over oxide thickness range

James Prendergast, Eoin O'Driscoll, Ed Mullen, 2005, Microelectron. Reliab..

Implementation and benefits of introducing a computerised maintenance management system into a textile manufacturing company

James Prendergast, C. D. O’Donoghue, C. O'Donoghue, 2004 .

Electronics beyond CMOS (challenger)

James Prendergast, 2012 .

A technique to predict gate oxide reliability using fast on-line ramped Q/sub BD/ testing

John S. Suehle, J. Molyneaux, James Prendergast, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).

AN INVESTIGATION INTO THE RELEVANCE OF DOCUMENTATION FOR PROBLEM SOLVING IN EQUIPMENT CONTROLLED BY PROGRAMMABLE LOGIC CONTROLLERS (PLCS)

James Prendergast, Michael T. Barrett, J. Prendergast, 2007 .

Building In Reliability. Is Statistical Process Control Statistical Reliability Control

Eamonn Murphy, James Prendergast, 2004 .

Relationship between TDDB testing and wafer level ramped QBD testing using both fixed current and current density stressing

John S. Suehle, J. Molyneaux, James Prendergast, 2001, 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580).

Predicting gate oxide reliability from statistical process control nodes in integrated circuit manufacturing — a case study

Eamonn Murphy, James Prendergast, Malcom Stephenson, 1997 .

Predicting oxide reliability from in line process statistical reliability control

James Prendergast, Malcom Stephenson, Eamonn Murphy, 1996, 1996 International Integrated Reliability Workshop Final Report.

Investigation of the intrinsic SiO/sub 2/ area dependence using TDDB testing

James Prendergast, N. Finucane, J. Suehle, 1997, 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319).

TDDB characterisation of thin SiO/sub 2/ films with bimodal failure populations

John S. Suehle, P. Chaparala, James Prendergast, 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.