Ching-Yuan Chen

Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model

Krishnendu Chakrabarty, Jiun-Lang Huang, Ching-Yuan Chen, 2020, 2020 IEEE European Test Symposium (ETS).

Reinforcement-Learning-Based Test Program Generation for Software-Based Self-Test

Jiun-Lang Huang, Ching-Yuan Chen, 2019, 2019 IEEE 28th Asian Test Symposium (ATS).

Pruning of Deep Neural Networks for Fault-Tolerant Memristor-based Accelerators

Krishnendu Chakrabarty, Ching-Yuan Chen, K. Chakrabarty, 2021, 2021 58th ACM/IEEE Design Automation Conference (DAC).

Efficient Identification of Critical Faults in Memristor Crossbars for Deep Neural Networks

Ching-Yuan Chen, Krishnendu Chakrabarty, K. Chakrabarty, 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Efficient Identification of Critical Faults in Memristor-Based Inferencing Accelerators

Krishnendu Chakrabarty, Ching-Yuan Chen, K. Chakrabarty, 2022, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.