Torsten Grüning

On the deterministic generation of short test sequences for the e-beam test of scan-based designs

Torsten Grüning, Josef Groβ, Andreas Geggier, 1992 .

DIATEST: a fast diagnostic test pattern generator for combinational circuits

Udo Mahlstedt, Torsten Grüning, Hartmut Koopmeiners, 1991, 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers.

Contest: a fast ATPG tool for very large combinational circuits

Wilfried Daehn, Udo Mahlstedt, Cengiz Özcan, 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.

Accelerated test pattern generation by cone-oriented circuit partitioning

Wilfried Daehn, Udo Mahlstedt, Cengiz Özcan, 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..

Stimuligenerierung für die Fehlerdiagnose digitaler Schaltungen mit Scan-Pfad unter Einbeziehung des Elektronenstrahltests

Torsten Grüning, 1993 .

Design for electron beam testability: On-chip generation of periodic test sequences in a scan path environment

Torsten Grüning, Josef Groβ, T. Grüning, 1992 .