D. Boning

Prediction of Variation in Advanced Process Technology Nodes

N. Drego, D. Boning, 2006 .

A Critical Enhancement in the Yield Analysis of Microsystems

S.P. Vudathu, R. Laur, D. Boning, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

An all-digital, highly scalable architecture for measurement of spatial variation in digital circuits

A. Chandrakasan, D. Boning, N. Drego, 2008, 2008 IEEE Asian Solid-State Circuits Conference.

Environmental Impact Evaluation Methodology for Emerging Silicon-Based Technologies

D. Boning, R. Reif, A. Somani, 2006, Proceedings of the 2006 IEEE International Symposium on Electronics and the Environment, 2006..

A MODIFICATION TO PRESTON ’ S EQUATION AND IMPACT ON PATTERN DENSITY EFFECT MODELING

D. Boning, D. Ouma, J. Chung, 1998 .

An integrated characterization and modeling methodology for CMP dielectric planarization

D. Boning, D. Ouma, J. Chung, 1998, Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102).

ELECTRICAL CHARACTERIZATION OF COPPER CHEMICAL MECHANICAL POLISHING

G. Bersuker, D. Boning, J. Chung, 1999 .