Paul Kurpas

Measurement uncertainties due to non-ideal calibration standards for unknown thru calibration

Ralf Doerner, Andrej Rumiantsev, Friedrich Lenk, 2013, 81st ARFTG Microwave Measurement Conference.

Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE

Frank Brunner, J. Schneider, Joachim Würfl, 2003, Microelectron. Reliab..

A flexible GaN MMIC enabling digital power amplifiers for the future wireless infrastructure

Andreas Wentzel, Wolfgang Heinrich, Paul Kurpas, 2015, 2015 IEEE MTT-S International Microwave Symposium.

Enabling GaN high speed devices: Microwave meets power electronics - And vice versa

Olof Bengtsson, Andreas Wentzel, Wolfgang Heinrich, 2013, 2013 European Microwave Integrated Circuit Conference.

A dual-band voltage-mode class-D PA for 0.8/1.8 GHz applications

Andreas Wentzel, Wolfgang Heinrich, Paul Kurpas, 2013, 2013 IEEE MTT-S International Microwave Symposium Digest (MTT).

Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing

Frank Brunner, Joachim Würfl, Matthias Rudolph, 2001, Microelectron. Reliab..

Effect of gate trench fabrication technology on reliability of AlGaN/GaN heterojunction field effect transistors

Matthias Schulz, Joachim Würfl, Eldad Bahat-Treidel, 2014, Microelectron. Reliab..

Reliability issues of GaN based high voltage power devices

Frank Brunner, Matthias Schulz, Joachim Würfl, 2011, Microelectron. Reliab..