Y. Raskin

Peculiarities of hole trapping in Al2O3-SiO2 gate dielectric stack

M. Lisiansky, Y. Roizin, Y. Raskin, 2017, Microelectron. Reliab..

Limit loads for laterally loaded I-section beams with consideration of shear

Y. Raskin, L. Belenkiy, 2003 .

Estimate of the ultimate load on structural members subjected to lateral loads

Y. Raskin, L. Belenkiy, 2001 .