Q. Cheng

Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment

H. Zhang, P. Zhang, T. N. Chen, 2016, Microelectron. Reliab..

A kernel-based mixed effect regression model for earthquake ground motions

Jale Tezcan, Q. Cheng, Y. Dak Hazirbaba, 2016, Adv. Eng. Softw..

Improvement of reliability for high-ohmic Cr-Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water

H. Zhang, P. Zhang, T. N. Chen, 2016, Microelectron. Reliab..