Fulvio Infante

Single Event Transient acquisition and mapping for space device Characterization

Giovanna Mura, Kevin Sanchez, Guillaume Bascoul, 2016, Microelectron. Reliab..

Hyperspectral instrumentation to image and characterize the fluorescence of materials

Delphine Faye, Philippe Walter, Fulvio Infante, 2016, Optical Engineering + Applications.

ATE and lock-in thermography coupling techniques for a 3D defect localization in a 4-stacked die memory

Kevin Sanchez, Fulvio Infante, Nicolas Courjault, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization

Chee Lip Gan, Philippe Perdu, Dean Lewis, 2011, Microelectron. Reliab..

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations

Philippe Perdu, Dean Lewis, Fulvio Infante, 2010, Microelectron. Reliab..

Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization

Vincent Bley, Thierry Lebey, Philippe Perdu, 2015, Microelectron. Reliab..

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package

Philippe Perdu, Dean Lewis, Fulvio Infante, 2009, Microelectron. Reliab..