Rusty Harris

CMOS Scaling For the Next Decade: Trends, Challenges and Opportunities

Hsing-Huang Tseng, Se-Hoon Lee, Raj Jammy, 2008 .

CMOS Scaling Beyond High-k and Metal Gates

Raj Jammy, Prashant Majhi, Jungwoo Oh, 2007 .

Impact of mechanical stress on gate tunneling currents of germanium and silicon p-type metal-oxide-semiconductor field-effect transistors and metal gate work function

Scott E. Thompson, Toshinori Numata, Toshikazu Nishida, 2008 .