Bruce F. Cockburn

Deterministic tests for detecting scrambled pattern-sensitive faults in RAMs

Bruce F. Cockburn, 1995, Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing.

A synthesizable ram bist circuit for applying an O(n log/sub 2/ n) test that detects scrambled static pattern-sensitive faults

D. P. Sarda, Bruce F. Cockburn, 1996, IEEE International Workshop on Memory Technology, Design and Testing,.

Parallel filtering and thresholding of images on the SIMD DSP-RAM architecture

Bruce F. Cockburn, S. J. Dillen, 2002, IEEE CCECE2002. Canadian Conference on Electrical and Computer Engineering. Conference Proceedings (Cat. No.02CH37373).