Euncheol Lee

Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology

Seoung Bum Kim, Yoon Sang Cho, Hyungu Kahng, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM

Seungbae Lee, Yongsung Ji, Taiki Uemura, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET

Youngin Park, Seungbae Lee, Yongsung Ji, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction

Hyewon Shim, Euncheol Lee, Kihyun Choi, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

Chip to Package Interaction Risk Assessment of FCBGA Devices using FEA Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm Optimization Technique

Moon Soo Lee, Euncheol Lee, Hwasung Rhee, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).