J. Schmitz
发表
M. Pollnau,
A. Driessen,
J. Schmitz,
2007
.
J. Schmitz,
Y. Bilevych,
V.M. Blanco Carballo,
2008,
2008 IEEE Nuclear Science Symposium Conference Record.
K. Ludewigt,
Th. Riesbeck,
Th. Baumgärtel,
2014,
Security and Defence.
J. Schmitz,
R.J.E. Hueting,
M.P.J. Tiggelman,
2009,
IEEE Transactions on Electron Devices.
J. Schmitz,
M.P.J. Tiggelman,
K. Reimann,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
B. K. Boksteen,
A. Heringa,
J. Schmitz,
2015,
2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
H. Wallinga,
E. Hoekstra,
E.A.M. Klumperink,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
J. Schmitz,
A.J. Hof,
M.H.H. Weusthof,
2004,
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).
J. Schmitz,
A.Y. Kovalgin,
N. Stavitski,
2005,
2006 IEEE International Conference on Microelectronic Test Structures.
Jiahui Wang,
J. Schmitz,
C. Salm,
2013,
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).
Albert Albers,
Martin Fritz,
Alexander Schwarz,
2010
.
J. Schmitz,
G.T. Sasse,
M.P.J. Tiggelman,
2006,
2006 IEEE International Conference on Microelectronic Test Structures.
Steffen Scherr,
Grzegorz Adamiuk,
Thomas Zwick,
2012
.
J. Schmitz,
A. Y. Kovalgin,
J. Lu,
2010,
2010 International Electron Devices Meeting.
J. Schmitz,
G.T. Sasse,
R.J. de Vries,
2007,
2007 IEEE International Conference on Microelectronic Test Structures.
J. Schmitz,
G.T. Sasse,
H. de Vries,
2005,
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..