Nagarajan Raghavan

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Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures

Qing Yang, Pham Luu Trung Duong, Xuechu Xu, 2018, Microelectron. Reliab..

Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, 2015, 2015 IEEE International Reliability Physics Symposium.

Percolation Framework and Monte Carlo Techniques for Improved Probabilistic Design of Variability in Products and Systems

Nagarajan Raghavan, Kin Leong Pey, K. Pey, 2017 .

Learning the Stress-Strain Relationships of Ultra-Thin Package Materials using a Bayesian Approach

Nagarajan Raghavan, Cheryl Selvanayagam, Pham Luu Trung Duong, 2020, 2020 IEEE 70th Electronic Components and Technology Conference (ECTC).

Inverse Design of Substrate from Warpage Surrogate Model Using Global Optimisation Algorithms in Ultra-Thin Packages

Nagarajan Raghavan, Cheryl Selvanayagam, Pham Luu Trung Duong, 2020, 2020 IEEE 70th Electronic Components and Technology Conference (ECTC).

Data-Driven Design Space Exploration and Exploitation for Design for Additive Manufacturing

Pham Luu Trung Duong, David W. Rosen, Nagarajan Raghavan, 2019, Journal of Mechanical Design.

Study on Partial Stratified Resampling for Particle Filter Based Prognosis on Li-Ion Batteries

Nagarajan Raghavan, Karkulali Pugalenthi, N. Raghavan, 2018, 2018 Prognostics and System Health Management Conference (PHM-Chongqing).

Erratum: “Data-Driven Design Space Exploration and Exploitation for Design for Additive Manufacturing” [ASME J. Mech. Des. 2019, 141(10), p. 101101; DOI: 10.1115/1.4043587]

David W. Rosen, Nagarajan Raghavan, Dong Wang, 2019, Journal of Mechanical Design.

Deep Learning Based Detection for Mitigating Sneak Path Interference in Resistive Memory Arrays

Guanghui Song, Nagarajan Raghavan, Xingwei Zhong, 2020, 2020 IEEE International Conference on Consumer Electronics - Asia (ICCE-Asia).

Application of expectation maximization and Kalman smoothing for prognosis of lumen maintenance life for light emitting diodes

Pham Luu Trung Duong, Nagarajan Raghavan, Hyunseok Park, 2018, Microelectron. Reliab..

Tensor Train Decomposition for Data-Driven Prognosis of Fracture Dynamics in Composite Materials

Pham Luu Trung Duong, Shaista Hussain, Nagarajan Raghavan, 2020, 2020 IEEE Aerospace Conference.

A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study

Nagarajan Raghavan, Karkulali Pugalenthi, 2018, Microelectron. Reliab..

Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices

Xing Wu, Nagarajan Raghavan, Michel Bosman, 2016, Microelectron. Reliab..

Data Driven Prognosis of Fracture Dynamics Using Tensor Train and Gaussian Process Regression

Pham Luu Trung Duong, Shaista Hussain, Nagarajan Raghavan, 2020, IEEE Access.

Conductive filament formation at grain boundary locations in polycrystalline HfO2 -based MIM stacks: Computational and physical insight

Nagarajan Raghavan, Alok Ranjan, Michel Bosman, 2016, Microelectron. Reliab..

Piecewise Model-Based Online Prognosis of Lithium-Ion Batteries Using Particle Filters

Nagarajan Raghavan, Karkulali Pugalenthi, Hyunseok Park, 2020, IEEE Access.

Neural Network Assisted Speed Up of High Fidelity Warpage Simulations towards Design for Reliability in Ultra-Thin Packages

Pham Luu Trung Duong, Nagarajan Raghavan, Cheryl Selvanayagam, 2019, 2019 IEEE CPMT Symposium Japan (ICSJ).

Reliability of emerging nanodevices

Nagarajan Raghavan, K. L. Pey, K. Pey, 2015 .

Simulated Annealing for Mixture Distribution Analysis and its Applications to Reliability Testing

Cher Ming Tan, Nagarajan Raghavan, C. Tan, 2008 .

Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO2 on reliability of SiOx interfacial layer

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, 2014, Microelectron. Reliab..

Temporal Convolutional Network Based Transfer Learning for Structural Health Monitoring of Composites

Shaista Hussain, Nagarajan Raghavan, Mark Hyunpong Jhon, 2020 .

Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride — The Knowns and the Unknowns

Nagarajan Raghavan, Kin Leong Pey, Kalya Shubhakar, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms

Daniel D. Frey, Nagarajan Raghavan, N. Raghavan, 2015, Microelectron. Reliab..

Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction

Nagarajan Raghavan, Kin Leong Pey, J. H. Lim, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices

Daniel D. Frey, Nagarajan Raghavan, Michel Bosman, 2014, Microelectron. Reliab..

Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM

Daniel D. Frey, Nagarajan Raghavan, Michel Bosman, 2015, 2015 IEEE International Reliability Physics Symposium.

Machine Learning Approach to Improve Accuracy of Warpage Simulations

Nagarajan Raghavan, Cheryl Selvanayagam, Rathin Mandal, 2019, 2019 IEEE 69th Electronic Components and Technology Conference (ECTC).

Hierarchical main path analysis to identify decompositional multi-knowledge trajectories

Nagarajan Raghavan, Dongwook Hwang, Changbae Mun, 2020, J. Knowl. Manag..

Remaining useful life estimation for systems subject to multiple degradation mechanisms

Daniel D. Frey, Nagarajan Raghavan, N. Raghavan, 2015, 2015 IEEE Conference on Prognostics and Health Management (PHM).

A metaheuristic approach to remaining useful life estimation of systems subject to multiple degradation mechanisms

Nagarajan Raghavan, Pham L. T. Duong, 2017, 2017 IEEE International Conference on Prognostics and Health Management (ICPHM).

Uncertainty quantification in prognostics: A data driven polynomial chaos approach

Nagarajan Raghavan, Pham L. T. Duong, N. Raghavan, 2017, 2017 IEEE International Conference on Prognostics and Health Management (ICPHM).

多結晶HfO_2をベースにしたMIMスタックにおける粒界位置における導電性フィラメント形成:計算と物理的洞察【Powered by NICT】

Nagarajan Raghavan, K. Shubhakar, S. Mei, 2016 .

A framework to practical predictive maintenance modeling for multi-state systems

Cher Ming Tan, Nagarajan Raghavan, C. Tan, 2008, Reliab. Eng. Syst. Saf..

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

Cher Ming Tan, Nagarajan Raghavan, 2010, 2010 Prognostics and System Health Management Conference.

Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, 2014, Microelectron. Reliab..

Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, 2015, Microelectron. Reliab..

An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO2/SiOx dielectric stacks for failure analysis

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, 2015, Microelectron. Reliab..

Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes

Pham Luu Trung Duong, Nagarajan Raghavan, Hyunseok Park, 2018, Microelectron. Reliab..

Tutorial: Physics of failure based prognostics

Nagarajan Raghavan, 2017, 2017 Prognostics and System Health Management Conference (PHM-Harbin).

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms

Nagarajan Raghavan, Kin Leong Pey, Andrea Padovani, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis

Pham Luu Trung Duong, Nagarajan Raghavan, Cheryl Selvanayagam, 2020, IEEE Access.

Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Real-time update of multi-state system reliability using prognostic data-driven techniques

Daniel D. Frey, Nagarajan Raghavan, 2016, 2016 Annual Reliability and Maintainability Symposium (RAMS).

Generalized Convolution Simulation Stack for RRAM Device based Deep Learning Neural Network

Nagarajan Raghavan, Nagaraj Lakshmana Prabhu, N. Raghavan, 2020, 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

A new transformerless series hybrid active power filter (TL-SHAPF) topology

Krishna Vasudevan, Nagarajan Raghavan, Thomas Ellinger, 2006 .

Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks

Nagarajan Raghavan, Eng Huat Toh, Wen Siang Lew, 2020 .

Statistical Analysis ofMulti-Censored Electromigration Data using theEM Algorithm

Nagarajan Raghavan, N. Raghavan, 2007 .

Prognosis of power MOSFET resistance degradation trend using artificial neural network approach

Nagarajan Raghavan, Karkulali Pugalenthi, Hyunseok Park, 2019, Microelectronics Reliability.

Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach

Daniel D. Frey, Nagarajan Raghavan, Michel Bosman, 2015, Microelectron. Reliab..

Prognostic Health Management for LED with Missing Data: Multi-task Gaussian Process Regression Approach

Nagarajan Raghavan, Pham Luu Trung Duong, 2018, 2018 Prognostics and System Health Management Conference (PHM-Chongqing).

Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis

Nagarajan Raghavan, Rathin Mandal, Cheryl Selvanayagam, 2018, Microelectron. Reliab..

High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact

Nagarajan Raghavan, Kin Leong Pey, Kalya Shubhakar, 2014, Microelectron. Reliab..

Performance and reliability trade-offs for high-κ RRAM

Nagarajan Raghavan, N. Raghavan, 2014, Microelectron. Reliab..

Lubrication Oil Degradation Trajectory Prognosis with ARIMA and Bayesian Models

Nagarajan Raghavan, Monika Tanwar, 2019, 2019 International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC).

A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques

Nagarajan Raghavan, Dan Jiang, Weihua Lin, 2020, IEEE Access.

Analysis of quantum conductance, read disturb and switching statistics in HfO2 RRAM using conductive AFM

Nagarajan Raghavan, Alok Ranjan, Kin Leong Pey, 2016, Microelectron. Reliab..

An approach to statistical analysis of gate oxide breakdown mechanisms

Cher Ming Tan, Nagarajan Raghavan, 2007, Microelectron. Reliab..

Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery

Pham Luu Trung Duong, Nagarajan Raghavan, N. Raghavan, 2018, Microelectron. Reliab..

Roughening Particle Filter Based Prognosis on Power MOSFETs Using ON-Resistance Variation

Nagarajan Raghavan, Karkulali Pugalenthi, 2018, 2018 Prognostics and System Health Management Conference (PHM-Chongqing).

Root cause analysis based maintenance policy

Cher Ming Tan, Nagarajan Raghavan, 2007 .

Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory

Daniel D. Frey, Nagarajan Raghavan, Kin Leong Pey, 2014, Microelectron. Reliab..

導電性A FMを用いたHfO_2RRAMにおける量子コンダクタンス,読出し妨害とスイッチング統計の解析【Powered by NICT】

Nagarajan Raghavan, K. Shubhakar, A. Ranjan, 2016 .

Uncertainty quantification in nanowire growth modeling - A precursor to quality semiconductor nanomanufacturing

Qing Yang, Xuechu Xu, Nagarajan Raghavan, 2017, Microelectron. Reliab..

Application of multiplicative dimensional reduction method for uncertainty quantification and sensitivity analysis of MEMS electrostatic actuators

Pham Luu Trung Duong, Trong Toan Tran, Nagarajan Raghavan, 2017, Microelectron. Reliab..

Physics-of-Failure Approach to PHM

Jie Gu, Michael Pecht, Nagarajan Raghavan, 2018, Prognostics and Health Management of Electronics.

Exploring the Power – Prediction Accuracy Trade-Off in a Deep Learning Neural Network using Wide Compliance RRAM Device

Nagarajan Raghavan, Eng Huat Toh, Nagaraj Lakshmana Prabhu, 2019, 2019 8th International Symposium on Next Generation Electronics (ISNE).

Failure of Weibull distribution to represent switching statistics in OxRAM

Nagarajan Raghavan, N. Raghavan, 2017 .

Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress

Shurong Dong, Nagarajan Raghavan, Hei Wong, 2018, Microelectron. Reliab..

Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices

Nagarajan Raghavan, N. Raghavan, 2016, Microelectron. Reliab..

Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems"

Cher Ming Tan, Nagarajan Raghavan, 2009, Reliab. Eng. Syst. Saf..

AI-Assisted Package Design for Improved Warpage Control of Ultra-Thin Packages

Pham Luu Trung Duong, Nagarajan Raghavan, Cheryl Selvanayagam, 2020, 2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).

Function score-based technological trend analysis

Nagarajan Raghavan, Dongwook Hwang, Subarna Basnet, 2020 .

Lubricating Oil Remaining Useful Life Prediction Using Multi-Output Gaussian Process Regression

Nagarajan Raghavan, Monika Tanwar, N. Raghavan, 2020, IEEE Access.

A rapid design exploration framework under additive manufacturing process uncertainty

Yi Xiong, David W. Rosen, Nagarajan Raghavan, 2018 .

Comparative study of non-standard power diodes

Cher Ming Tan, Nagarajan Raghavan, Chase Wang, 2009, 2009 4th IEEE Conference on Industrial Electronics and Applications.

Predicting Lumen Degradation of Light Emitting Diodes Using Hybrid Particle Filter Trained Neural Networks

Nagarajan Raghavan, Karkulali Pugalenthi, Hyunseok Park, 2021, IEEE Access.

Developmental Trajectories in Blockchain Technology Using Patent-Based Knowledge Network Analysis

Nagarajan Raghavan, Sejun Yoon, Sohee Kim, 2021, IEEE Access.

Inverse Design for Low Warpage Ultra-Thin Packages Using Constrained Particle Swarm Optimization

Nagarajan Raghavan, Pham Luu Trung Duong, Cheryl Selvanayagam, 2021, IEEE Access.

Condition Based Maintenance Policy for Crankcase Lubricating Oil in Diesel Locomotives

Nagarajan Raghavan, Sidra Khanam, Monika Tanwar, 2021, 2021 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM).

Hybrid Particle Filter Trained Neural Network for Prognosis of Lithium-Ion Batteries

Nagarajan Raghavan, Karkulali Pugalenthi, Shaista Hussain, 2021, IEEE Access.

Computational Failure Analysis of In-Memory RRAM Architecture for Pattern Classification CNN Circuits

Nagarajan Raghavan, Nagaraj Lakshmana Prabhu, N. Raghavan, 2021, IEEE Access.

Bias Suppression Framework for Detrending Mean of Multi-Output Gaussian Process Regression in LED Remaining Storage Life Prognosis

Nagarajan Raghavan, Pham Luu Trung Duong, Hyunseok Park, 2021, IEEE Access.

Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms

Nagarajan Raghavan, Dan Jiang, Weihua Lin, 2021, IEEE Access.

A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction

Nagarajan Raghavan, Dan Jiang, Weihua Lin, 2021, IEEE Access.

Study of preferential localized degradation and breakdown of HfO2/SiOx dielectric stacks at grain boundary sites of polycrystalline HfO2 dielectrics

Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, 2013 .