Patrick Tounsi

发表

Using Compact Thermal Modelling for the Investigation of a Cooling System Dysfunction Applied to a Power Module with Double Sided Cooling

Anaïs Cassou, Patrick Tounsi, Jean-Pierre Fradin, 2019, 2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems".

Characterization and modelling of ageing failures on power MOSFET devices

Marc Legros, Patrick Tounsi, Benjamin Khong, 2007, Microelectron. Reliab..

Transient compact modeling for multi chips components

Patrick Tounsi, Wasim Habra, Jean-Marie Dorkel, 2005 .

Development of SiC MOSFET Electrical Model and Experimental Validation: Improvement and Reduction of Parameter Number

Patrick Tounsi, Jean-Pierre Fradin, Quang Chuc Nguyen, 2019, 2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems".

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue

Philippe Dupuy, Marc Legros, Patrick Tounsi, 2005, Microelectron. Reliab..

Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis

Patrick Tounsi, Alexandre Boyer, Nabil El Belghiti Alaoui, 2018, J. Electron. Test..

Innovative methodology to extract dynamic compact thermal models: Application to power devices

Patrick Tounsi, Jean-Marie Dorkel, Toufik Azoui, 2010, 2010 16th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).

3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET

Patrick Tounsi, A. Deram, Jean-Baptiste Sauveplane, 2008, Microelectron. Reliab..

Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations

Patrick Tounsi, A. Bourennane, Marie Breil, 2012, Microelectron. Reliab..

Using infrared thermal responses for PCBA production tests: Feasibility study

Patrick Tounsi, Alexandre Boyer, Nabil El Belghiti Alaoui, 2019, Microelectronics Reliability.

3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs

Philippe Dupuy, Patrick Tounsi, Jean-Marie Dorkel, 2011, Microelectron. Reliab..

Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications

Régis Meuret, Patrick Tounsi, Michel Mermet-Guyennet, 2008, Microelectron. Reliab..

Distributed electrothermal modeling methodology for MOS gated power devices simulations

Patrick Tounsi, Jean-Marie Dorkel, Emmanuel Marcault, 2013, Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013.

Compact thermal modelling for fast simulating consequences of pump defect: application to power module with double efficient cooling

Patrick Tounsi, Jean-Pierre Fradin, Anas Cassou, 2018, 2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).

VDMOS electrical parameters potentially usable as mechanical state indicators for power VDMOS assemblies

Patrick Tounsi, Marie Breil, Jean-Marie Dorkel, 2014 .

Adaptive multiple cooling surfaces Compact Thermal Model (CTM), and boundary condition independent multiple heat sources CTM

Patrick Tounsi, J.-M. Dorkel, Jean-Baptiste Sauveplane, 2009, 2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium.

Characterization method of thermomechanical parameters for microelectronic materials

Patrick Tounsi, Pierre Temple-Boyer, Jean-Marie Dorkel, 2002, Microelectron. Reliab..

New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs

Patrick Tounsi, Alexandre Boyer, Nabil El Belghiti Alaoui, 2018, 2018 IEEE 27th North Atlantic Test Workshop (NATW).

Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling

Patrick Tounsi, Jean-Marie Dorkel, Jean-Michel Reynes, 2013, Microelectron. Reliab..

New defect detection approach using near electromagnetic field probing of high density PCBAs

Patrick Tounsi, Alexandre Boyer, Nabil El Belghiti Alaoui, 2018, Microelectron. Reliab..

Implementation of Thermoelectric Generators in Airliners for Powering Battery-Free Wireless Sensor Networks

Patrick Tounsi, Jean-Marie Dilhac, Romain Monthéard, 2014, Journal of Electronic Materials.

Temperature Sensing for Power MOSFETs in Short-Duration Avalanche Mode

Patrick Tounsi, Jean-Marie Dorkel, Jean-Michel Reynes, 2014, IEEE Transactions on Device and Materials Reliability.