Yi-Chun Chan

Investigation on the abnormal resistive switching induced by ultraviolet light exposure based on HfOx film

Kow-Ming Chang, Kou-Chen Liu, Chun-Chih Kuo, 2010, Microelectronics Reliability.

The resistive switching characteristics of a Ti/Gd2O3/Pt RRAM device

Kow-Ming Chang, Kou-Chen Liu, Chun-Wen Cheng, 2010, Microelectron. Reliab..