Leonhard Heis

New methodology for on-chip RF reliability assessment

Peter Baumgartner, Leonhard Heis, Andreas Lachmann, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Analyzing the effects of peripheral circuit aging of embedded SRAM architectures

Ilia Polian, Leonhard Heis, Josef Kinseher, 2017, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017.

NBTI modeling in analog circuits and its application to long-term aging simulations

Christoph Sohrmann, Tibor Grasser, Leonhard Heis, 2014, 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).