B. DeSalvo
发表
Pierre Morin,
Sylvain Maitrejean,
Frederic Allibert,
2016
.
B. DeSalvo,
M. Alayan,
E. Vianello,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
B. DeSalvo,
L. Perniola,
D. Vuillaume,
2012,
2012 4th IEEE International Memory Workshop.
B. DeSalvo,
D. Querlioz,
E. Vianello,
2012,
2012 International Electron Devices Meeting.
B. DeSalvo,
E. Vianello,
E. Nowak,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
B. DeSalvo,
Damien Querlioz,
Olivier Bichler,
2013
.
G. Reimbold,
B. DeSalvo,
J. Cluzel,
2010,
2010 International Conference on Microelectronic Test Structures (ICMTS).
B. DeSalvo,
Bruce B. Doris,
M. Vinet,
2016
.
B. DeSalvo,
Elisa Vianello,
Philippe Candelier,
2016
.
B. DeSalvo,
E. Vianello,
L. Perniola,
2015,
2015 IEEE International Memory Workshop (IMW).
B. DeSalvo,
V. Jousseaume,
E. Vianello,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
O. Rozeau,
O. Faynot,
G. Ghibaudo,
2014,
2014 IEEE International Electron Devices Meeting.
G. Reimbold,
B. DeSalvo,
A. Toffoli,
2012,
2012 IEEE International Conference on Microelectronic Test Structures.
B. DeSalvo,
Manan Suri,
B. Desalvo,
2012
.
Improved method for the oxide thickness extraction in MOS structures with ultrathin gate dielectrics
B. DeSalvo,
Gerard Ghibaudo,
Emmanuel Vincent,
2000
.
B. DeSalvo,
S. Jeannot,
Y. Nishi,
2014,
2014 IEEE International Electron Devices Meeting.
G. Ghibaudo,
B. DeSalvo,
S. Bruyere,
1999,
ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307).
G. Ghibaudo,
B. DeSalvo,
D. Lafond,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
O. Faynot,
Y. Escarabajal,
B. Lherron,
2014,
2014 IEEE International Electron Devices Meeting.
B. DeSalvo,
L. Perniola,
Olivier Bichler,
2013
.
B. DeSalvo,
Gerard Ghibaudo,
G. Pananakakis,
1999
.
B. DeSalvo,
D. Lafond,
G. Molas,
2005
.
G. Ghibaudo,
B. DeSalvo,
X. Li,
2013,
IEEE Transactions on Electron Devices.