Juliane Reinhardt

Ptychography with a Virtually Enlarged Illumination

Christian G. Schroer, Felix Wittwer, Frank Seiboth, 2018 .

Nanofocused x-ray beams applied for mapping strain in core-shell nanowires

Lars Samuelson, Robert Feidenhans'l, Gerald Falkenberg, 2015, SPIE Optical Engineering + Applications.

Advanced denoising for X-ray ptychography.

Tieyong Zeng, David Shapiro, Jie Zhang, 2018, Optics express.

Hard x-ray nanofocusing with refractive x-ray optics: full beam characterization by ptychographic imaging

Daniel Nilsson, Christian G. Schroer, Gerald Falkenberg, 2013, Optics & Photonics - Optical Engineering + Applications.

Hard x-ray nanofocusing by refractive lenses of constant thickness

Christian G. Schroer, Karola Richter, Johann W. Bartha, 2014 .

High-resolution chemical imaging of gold nanoparticles using hard x-ray ptychography

Christian G. Schroer, Gerd Wellenreuther, Gerald Falkenberg, 2013 .

Influence of gas atmospheres and ceria on the stability of nanoporous gold studied by environmental electron microscopy and In situ ptychography

Christian G. Schroer, Torsten Scherer, Juliane Reinhardt, 2016 .

Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam

Lars Samuelson, Robert Feidenhans'l, Gerald Falkenberg, 2015 .

Beamstop-based low-background ptychography to image weakly scattering objects.

Gerald Falkenberg, Robert Hoppe, Juliane Reinhardt, 2017, Ultramicroscopy.

Stability of a Bifunctional Cu-Based Core@Zeolite Shell Catalyst for Dimethyl Ether Synthesis Under Redox Conditions Studied by Environmental Transmission Electron Microscopy and In Situ X-Ray Ptychography.

Zoltan Balogh, Wilhelm Schwieger, Juliane Reinhardt, 2017, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.

Enabling Flexible Polymer Tandem Solar Cells by 3D Ptychographic Imaging

Mikkel Jørgensen, Roar R. Søndergaard, Frederik C. Krebs, 2015 .

Hard X-ray Resonant Ptychography for Chemical Imaging at the Sensitivity Limit

Christian G. Schroer, Martin Seyrich, Andreas Schropp, 2018, Microscopy and Microanalysis.