Weon-Jong Kim

Insulation deterioration diagnosis on ultra high voltage power cables

D. G. Byun, Hyun-Taek Shin, Weon-Jong Kim, 2003, Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat. No.03CH37417).

Dependence of Efficiency Improvement and Operating-Voltage Reduction of OLEDs on Thickness Variation in the PTFE Hole-Injection Layer

Tae Wan Kim, Weon-Jong Kim, Jin-Woong Hong, 2007 .