Dhiraj Goswami

At-speed scan tests: Reality or fantasy?

Dhiraj Goswami, Nilanjan Mukherjee, 2007 .

Improved handling of false and multicycle paths in ATPG

Dhiraj Goswami, Kun-Han Tsai, Bruce Swanson, 2006, 24th IEEE VLSI Test Symposium.

Test Generation in the Presence of Timing Exceptions and Constraints

Dhiraj Goswami, Janusz Rajski, Kun-Han Tsai, 2007, 2007 44th ACM/IEEE Design Automation Conference.