G. Pourtois
发表
D. Mocuta,
D. Fried,
C. J. Wilson,
2016,
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
C. Huyghebaert,
A. Leonhardt,
D. Lin,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
L. Goux,
B. Govoreanu,
S. Kundu,
2017,
2017 Symposium on VLSI Technology.
L. Goux,
B. Govoreanu,
S. Kundu,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
L. Goux,
B. Govoreanu,
2012,
2012 IEEE International Integrated Reliability Workshop Final Report.
S. De Gendt,
R. Degraeve,
G. Groeseneken,
2007,
IEEE Transactions on Electron Devices.
S. De Gendt,
S. Van Elshocht,
L. Pantisano,
2006,
IEEE Transactions on Electron Devices.
L. Witters,
N. Collaert,
S. Sioncke,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
L. Goux,
B. Govoreanu,
2014,
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.