Mark R. Barber

Frequency enhancement of digital VLSI test systems

Leslie Ackner, Mark R. Barber, 1990, Proceedings. International Test Conference 1990.

Subnanosecond Timing Measurements on MOS Devices Using Modern VLSI Test Systems

Mark R. Barber, 1983, ITC.

Fundamental Timing Problems in Testing MOS VLSI on Modern ATE

Mark R. Barber, 1984, IEEE Design & Test of Computers.

Timing Measurements on CMOS VLSI Devices Designed to Drive TTL Loads

Mark R. Barber, Walter I. Satre, 1986, ITC.

Microwave semiconductor devices and their circuit applications

Mark R. Barber, H. A. Watson, M. Barber, 1969 .