E. Napoli

Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2007, Microelectron. Reliab..

A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2010, Microelectron. Reliab..

DISSIPATIVE STRUCTURES IN EXTREMELY DILUTED SOLUTIONS OF HOMEOPATHIC MEDICINES: A MOLECULAR MODEL BASED ON PHYSICO-CHEMICAL AND GRAVIMETRIC EVIDENCES

E. Napoli, V. Elia, V. Elia, 2010 .

Detection of localized UIS failure on IGBTs with the aid of lock-in thermography

Andrea Irace, Giovanni Breglio, Paolo Spirito, 2008, Microelectron. Reliab..