N. Singh

Determination of worst case input combinations of nanoscale circuits using Bayesian networks

V. S. Asirvadam, N. H. Hamid, U. Khalid, 2012, 2012 4th International Conference on Intelligent and Advanced Systems (ICIAS2012).

A Novel Error-Detection Mechanism for Digital Circuits Using Markov Random Field Modelling

V. S. Asirvadam, N. H. Hamid, U. Khalid, 2012, 2012 Fourth International Conference on Computational Intelligence and Communication Networks.