Changyuan Han

A calibration method of the system error used for CCD MTF measurement

Changyuan Han, 1996, International Commission for Optics.

Common-path and phase-shift interferometer for length measurement

Hua Ai, Xudong Han, Changyuan Han, 2004, SPIE Optics East.

MTF measurement for testing microscopic objective

Bin Liu, Wei Li, Changyuan Han, 1992, Optics & Photonics.

Interferometric testing for large optical elements

Bin Zhang, Xiaohui Zhang, Shenghui Zhang, 2000, International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT).

Heterodyne common-path interferometer for testing surface roughness

Bin Liu, Zhenwu Lu, Changyuan Han, 1992, Other Conferences.

Computer-aided alignment of the complex optical system

Cheng Wang, Xiaohui Zhang, Bin Zhang, 2000, International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT).

Wavefront measurement with synthesizing method

Cheng Wang, Xuemei Liu, Hongyan Zhang, 2000, International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT).