Sung-Kyu Kwon

Modeling of T-model equivalent circuit for spiral inductors in 90 nm CMOS technology

Choul-Young Kim, Jin-Woong Jeong, Sung-Kyu Kwon, 2015, Proceedings of the 2015 International Conference on Microelectronic Test Structures.

Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology

Choul-Young Kim, Jin-Woong Jeong, Sung-Kyu Kwon, 2015 .

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs

Sung-Kyu Kwon, Hi-Deok Lee, Ho-Young Kwak, 2013, IEICE Trans. Electron..

A novel BJT structure for high- performance analog circuit applications

Sung-Kyu Kwon, Jae-Nam Yu, Hi-Deok Lee, 2013, 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).

Novel PNP BJT Structure to Improve Matching Characteristics for Analog and Mixed Signal Integrated Circuit Applications

Sung-Kyu Kwon, Hi-Deok Lee, Ho-Young Kwak, 2013, IEICE Trans. Electron..

Modeling ofT-Model Equivalent Circuit for Spiral Inductors in 90 nm

Jin-Woong Jeong, Sung-Kyu Kwon, Jae-Nam Yu, 2015 .

Dependence of 1/f noise characteristics of NMOSFETs on body bias and temperature in sub-threshold region

Sung-Kyu Kwon, Jae-Hyung Jang, Song-Jae Lee, 2011, 2011 International Semiconductor Device Research Symposium (ISDRS).

A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

Byoung Hun Lee, Sung-Kyu Kwon, Sun-Ho Oh, 2014, IEEE Transactions on Electron Devices.

A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

Sung-Kyu Kwon, Jae-Hyung Jang, Hyuk-Min Kwon, 2012, IEEE Transactions on Semiconductor Manufacturing.

Effect of Nitrogen Concentration on Low-Frequency Noise and Negative Bias Temperature Instability of p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Nitrided Gate Oxide

Sung-Kyu Kwon, Ga-Won Lee, Min-Gyu Lim, 2011 .