P. Girard
发表
S. Pravossoudovitch,
L. Guiller,
C. Landrault,
2001,
Proceedings 10th Asian Test Symposium.
S. Pravossoudovitch,
A. Virazel,
P. Girard,
2003,
The Eighth IEEE European Test Workshop, 2003. Proceedings..
E. Bergeault,
J. Malinowski,
G. Freeman,
1997,
International Electron Devices Meeting. IEDM Technical Digest.