H.-J. Schulze

Reliability of power electronic devices against cosmic radiation-induced failure

Gerald Soelkner, Winfried Kaindl, H.-J. Schulze, 2004, Microelectron. Reliab..

Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations

H.-J. Schulze, B. Heinze, J. Lutz, 2008, Microelectron. J..