C.J. Wang

A new on-state drain-bias TDDB lifetime model and HCI effect on drain-bias TDDB of ultra thin oxide

K. Wu, P.J. Liao, Y.S. Tsai, 2008, 2008 IEEE International Reliability Physics Symposium.

A New NBTI Lifetime Model (Ig-model) and an Investigation on Oxide Thickness Effect on NBTI Degradation and Recovery

K. Wu, M.J. Chen, Chia Lin Chen, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

A New "Multi-step" Power-law TDDB Lifetime Model and Boron Penetration Effect on TDDB of Ultra Thin oxide

K. Wu, P.J. Liao, Chia Lin Chen, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.