K. Vaz

发表

Measurement technique for the extraction of differential S-parameters from single-ended S-parameters

K. Vaz, M. Caggiano, 2004, 27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004..

Error reducing techniques for the scattering parameter characterization of differential networks using a two-port network analyzer

K. Vaz, M. Caggiano, Ka Mun Ho, 2005, 28th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005..

Scattering parameter characterization of differential four-port networks using a two-port vector network analyzer

K. Vaz, M. Caggiano, Ka Mun Ho, 2005, Proceedings Electronic Components and Technology, 2005. ECTC '05..