Mike Foedisch
发表
Michael Shneier,
Tsai Hong,
Aya Takeuchi,
2004,
SPIE Optics East.
Raj Madhavan,
Craig Schlenoff,
Mike Foedisch,
2006,
35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06).
Craig Schlenoff,
Michael Shneier,
Mike Foedisch,
2005,
KRAS '05.
Raj Madhavan,
Tommy Chang,
Tsai Hong,
2005,
34th Applied Imagery and Pattern Recognition Workshop (AIPR'05).
Mike Foedisch,
Patrick Conrad,
P. Conrad,
2003,
32nd Applied Imagery Pattern Recognition Workshop, 2003. Proceedings..
Tommy Chang,
Ceryen Tan,
Michael O. Shneier,
2006,
SPIE Defense + Commercial Sensing.
Rajmohan Madhavan,
Craig Schlenoff,
Mike Foedisch,
2007
.
Raj Madhavan,
Stephen Balakirsky,
Craig Schlenoff,
2006,
2006 9th International Conference on Control, Automation, Robotics and Vision.
Aya Takeuchi,
Mike Foedisch,
2004,
33rd Applied Imagery Pattern Recognition Workshop (AIPR'04).
Raj Madhavan,
Craig Schlenoff,
Mike Foedisch,
2007,
SPIE Defense + Commercial Sensing.