H. W. Werner

Diagnostic techniques for failure analysis and reliability evaluation in VLSI technology

A. van der Wijk, H. W. Werner, 1990 .

Quantitative SIMS Depth Profiling of Semiconductor Materials and Devices

H. W. Werner, P. R. Boudewijn, H. Werner, 1986 .

Analytical assistance in semiconductor and electronic material technology

H. W. Werner, H. Werner, 1983 .

Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends

H. W. Werner, A. Benninghoven, H. Werner, 1987 .