Hong Xiao

发表

Challenges of systematic defect control in advanced DRAM Fab

Luke Lin, J.Y. Chen, Wen-Yi Wong, 2008, 2008 International Symposium on Semiconductor Manufacturing (ISSM).

Solar collector angle optimization for maximum air flow rate in the solar chimney

Hong Xiao, Fei Cao, Yufei Mao, 2016 .

The Research and Development as Well as Industrialization of Power Train Control Unit based on Changan Hybrid Electric Vehicle

Hong Xiao, Lin Fu, Jin-Qiang Yu, 2008, 2008 International Conference on Apperceiving Computing and Intelligence Analysis.

Forecast and Analysis of the Effectiveness of Changsha Rail Transit Based on CA/GIS

Hong Xiao, Pei-juan Zhu, Huai-yu Tian, 2010, 2010 International Conference on Electrical and Control Engineering.

Optimal design of a novel oil-water separator for raw oil produced from ASP flooding

Hong Xiao, Dan Zhang, Lu-hong Zhang, 2007 .

Study of devices leakage of 45nm node with different SRAM layouts using an advanced e-beam inspection systems

Yan Zhao, Hong Xiao, Jack Jau, 2009, Advanced Lithography.

Capturing buried defects in metal interconnections with electron beam inspection system

Hong Xiao, Pierre Lefebvre, Ximan Jiang, 2013, Advanced Lithography.

Experimental and theoretical analysis of roll flattening in the deformation zone for ultra-thin strip rolling

Hong Xiao, Gaofei Wang, Xiao Liu, 2018 .

Optical beam enhanced defect detection with electron beam inspection tools

Fei Wang, Yan Zhao, Hong Xiao, 2008, 2008 International Symposium on Semiconductor Manufacturing (ISSM).

Research on GPS Remote Precise Positioning of Power Transmission Line Inspection Robot

Hong Xiao, Biwu Yan, Lei Zheng, 2018 .

Study of Expert Control Systems for Power Transmission Line Inspection Robot

Hong Xiao, Biwu Yan, Lei Zheng, 2018 .

Fluid Flow Characteristics and Weld Formation Quality in Gas Tungsten Arc Welding of a Thick-Sheet Aluminum Alloy Structure by Varying Welding Position

Dong Du, Baohua Chang, Guoliang Han, 2018 .

Gaussian quadrature for optical design with noncircular pupils and fields, and broad wavelength range

Brian J. Bauman, Hong Xiao, 2010, International Optical Design Conference.

Post-WCMP leakage detection and monitoring on 65-nm devices using an advanced e-beam inspection system

Hong Xiao, Mingsheng Tsai, Wei-Yih Wu, 2005, ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..

Analysis of the Transition from Hexagon to Square Pattern in Dielectric Barrier Discharge

Lifang Dong, Yafeng He, Hong Xiao, 2008, 2008 Congress on Image and Signal Processing.

Improved model to solve influence coefficients of work roll deflection

Hong Xiao, Tie-yong Zhao, 2010 .

Inspection of 32nm imprinted patterns with an advanced e-beam inspection system

Fei Wang, S. V. Sreenivasan, Hong Xiao, 2009, Photomask Technology.

Analyzing Load Case of Mill Roller Bearing with Boundary Element Method

Xia Yang, Hong Xiao, 2009, 2009 International Conference on Measuring Technology and Mechatronics Automation.

Multi-energy Coordinated Evaluation for Energy Internet

Sun Jian, Hong Xiao, Wenting Xiong, 2017 .

Numerical modeling of wave–current forces acting on horizontal cylinder of marine structures by VOF method

Hong Xiao, Wenrui Huang, Jianhua Tao, 2013 .

High-throughput contact critical dimension and gray level value measurement

Hong Xiao, Jack Jau, Yan Zhao, 2006, SPIE Advanced Lithography.

A novel method for in-line process monitoring by measuring the gray level values of SEM images

Hong Xiao, Wei Fang, J. Jau, 2005, ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005..

Influence of model characteristic parameters on thermal effect analysis of solid-state laser

Hong Xiao, Tianzhuo Zhao, Shuzhen Nie, 2020, Other Conferences.

Printability study of reticle defects on wafer using Reticle Defect Review on E-beam review tools

Hong Xiao, Janay Camp, Dongsheng Fan, 2015, 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Research Progress on Electromagnetic Textile Materials

Hong Xiao, 2019 .

Full-Wafer Voltage Contrast Inspection for Detection of BEOL Defects

Hong Xiao, Oliver D. Patterson, Richard F. Hafer, 2015, IEEE Transactions on Semiconductor Manufacturing.

Enhancing thin dielectric remaining detection under polysilico plug of advanced DRAM by electron beam inspection

Wen-Yi Wong, I-Kai Hong, Hong Xiao, 2007, 2007 International Symposium on Semiconductor Manufacturing.

The searching and analyzing method of device virtual links based on historical SCDs and its tool implementation

Yongkang Zheng, Kai Li, Hong Xiao, 2016, 2016 International Conference on Smart Grid and Clean Energy Technologies (ICSGCE).