James E. Sundquist

SOI FinFET nFET-to-pFET Tracking Variability Compact Modeling and Impact on Latch Timing

Jim Johnson, Ning Lu, Jie Deng, 2015, IEEE Transactions on Electron Devices.

ESD design automation & methodology to prevent CDM failures in 130 & 90 nm ASIC design systems☆

Robert A. Proctor, Shunhua Chang, Joseph N. Kozhaya, 2006 .