Tomoaki Konishi

Testable Design for Electrical Testing of Open Defects at Interconnects in 3D ICs

Shyue-Kung Lu, Masaki Hashizume, Hiroyuki Yotsuyanagi, 2013, 2013 22nd Asian Test Symposium.

Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture

Masaki Hashizume, Hiroyuki Yotsuyanagi, Tomoaki Konishi, 2012, 2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE International.

A built-in test circuit for supply current testing of open defects at interconnects in 3D ICs

Masaki Hashizume, Hiroyuki Yotsuyanagi, Tomoaki Konishi, 2012, 2012 4th Electronic System-Integration Technology Conference.