R. Duane

Extraction of coupling ratios for Fowler–Nordheim programming conditions

A. Concannon, Alan Mathewson, P. O'Sullivan, 2001 .

A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications

A. Concannon, Alan Mathewson, Ray Duffy, 2003 .

Low-voltage micromechanical test structures for measurement of residual charge in dielectrics

Alan Mathewson, R. Duane, Conor O'Mahony, 2005 .

Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams

Alan Mathewson, Martin Hill, R. Duane, 2003 .

Oxide trapped charge and time to breakdown of pulsed current measurements in the Fowler-Nordheim regime

R. Duane, A. Martin, P. O'Sullivan, 1996, 1996 International Integrated Reliability Workshop Final Report.

Design for reliability

Alan Mathewson, S. Minehane, P. O'Sullivan, 2000 .

Investigation of trapped charge in oxides under fowler-nordheim stress using low bias conditions

Alan Mathewson, Paul K. Hurley, P. O'Sullivan, 1996 .

Extraction of the coupling coefficients for the top-floating-gate (TFG) flash EEPROM cell

A. Concannon, A. Mathewson, R. Duane, 2002, Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002..