L. Vachez

A distributed BIST architecture enabling extended sharing and debug capabilities

R. Tourki, L. Ben Ammar, J. Turki, 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..

A test solution for oxide thickness variations in the ATMEL TSTAC™ eFlash technology

L. Dilillo, A. Bosio, P. Girard, 2011, 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).