Nikhil Vaidya

Return loss characterization and analysis of high-speed serial interface

Chris Madden, Wendemagegnehu T. Beyene, Nikhil Vaidya, 2016, 2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS).

Return loss characterization and analysis of high-speed serial interface

Hai Lan, Chris Madden, Wendemagegnehu T. Beyene, 2015, 2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS).

A Review on Feature Extraction Techniques for CBIR

Deepak Kapgate, Nikhil Vaidya, Abhijeet Mallick, 2014 .