V. Ramachandran

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V. Ramachandran, 1996 .

Reliability Characterization of BEOL Vertical Natural Capacitor using Copper and Low-k SiCOH Dielectric for 65nm RF and Mixed-Signal Applications

J. Gill, M. Shinosky, V. Ramachandran, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Advanced passive devices for enhanced integrated RF circuit performance

D. Harame, X. Wang, J. Johnson, 2002, 2002 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.02CH37280).

A 0.13 /spl mu/m BiCMOS technology featuring a 200/280 GHz (f/sub T//f/sub max/) SiGe HBT

P. Gray, J. Dunn, G. Freeman, 2003, 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440).