S.C. Kelly

Optimisation of integrated RF varactors on a 0.35 /spl mu/m BiCMOS technology

J.A. Power, M. O'Neill, S.C. Kelly, 2003, International Conference on Microelectronic Test Structures, 2003..

Prediction of AC performance of double-polysilicon bipolar transistors from e-test parameters: An experiment

J.A. Power, E.C. Griffith, S.C. Kelly, 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).