Atman Yong Zhao

The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics

Wei-Ting Kary Chien, Liwen Zhang, Flora Cheng, 2015, 2015 IEEE International Reliability Physics Symposium.

Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests

Yueqin Zhu, Wei-Ting Kary Chien, Atman Yong Zhao, 2016, Microelectron. Reliab..

Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies

Zhijuan Wang, Wei-Ting Kary Chien, Liwen Zhang, 2017, Microelectron. Reliab..

Influence of I/O oxide process on the NBTI performance of 28 nm HfO2-based HKMG p-MOSFETs

Yueqin Zhu, Wei-Ting Kary Chien, Atman Yong Zhao, 2016, Microelectron. Reliab..