D. Khera

A machine-learning classification approach for IC manufacturing control based on test structure measurements

M. E. Zaghloul, D. Khera, L. W. Linholm, 1989 .

Knowledge verification of machine-learning procedures based on test structure measurements

V. C. Tyree, W. Hansford, Loren W. Linholm, 1990, Proceedings of the 1991 International Conference on Microelectronic Test Structures.

Getting the most out of your professional communications: A total quality approach

D. Khera, 1993, Proceedings Professional Communication Conference The New Face of Technical Communication: People, Processes, Products'.

A developmental expert system for test structure ata evaluation

M. W. Cresswell, D. Khera, L. W. Linholm, 1988, Proceedings of the IEEE International Conference on Microelectronic Test Structures.

Knowledge extraction techniques for expert system assisted wafer screening

M. W. Cresswell, A. Nagarajan, D. Khera, 1990, IEEE/SEMI International Symposium on Semiconductor Manufacturing Science.

A DEVELOPMENTAL EXPmT SYSTEM FOR TEST STRUC!WXW DATA EVALUATION*

M. W. Cresswell, D. Khera, L. W. Linholm, 1988 .

A neural network approach for classifying test structure results

C. L. Wilson, D. Khera, L. W. Linholm, 1989, Proceedings of the 1989 International Conference on Microelectronic Test Structures.

Increasing profitability and improving semiconductor manufacturing throughput using expert systems

M. W. Cresswell, A. Nagarajan, D. Khera, 1994 .

Test structure data classification using a directed graph approach

L.W. Linholm, M.W. Cresswell, D. Khera, 1990, International Conference on Microelectronic Test Structures.

A directed-graph classifier of semiconductor wafer-test patterns

M. W. Cresswell, Loren W. Linholm, D. Khera, 1992 .