Markus Paul Josef Mergens

Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate coupling behavior

Wolfgang Fichtner, S. Mettler, W. Wilkening, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate-coupling behaviour

Wolfgang Fichtner, Wolfgang Wilkening, Heinrich Wolf, 2000 .

Characterization and optimization of a bipolar ESD-device by measurements and simulations

Wolfgang Fichtner, Wolfgang Wilkening, Heinrich Wolf, 1999 .

Analysis of lateral DMOS power devices under ESD stress conditions

Wolfgang Fichtner, S. Mettler, W. Wilkening, 2000 .

On-chip ESD protection in integrated circuits

Markus Paul Josef Mergens, 2001 .

ESD protection considerations in high voltage technologies

Markus Paul Josef Mergens, 2006 .

ESD-level circuit simulation impact of interconnect RC-delay on HBM and CDM behavior

Wolfgang Fichtner, Wolfgang Wilkening, Heinrich Wolf, 2002 .

ESD protection solutions for high voltage technologies

Bart Keppens, Koen Gerard Maria Verhaege, Cong Son Trinh, 2004 .