Shiying Xiong

Gate line-edge roughness effects in 50-nm bulk MOSFET devices

Shiying Xiong, Jeffrey Bokor, Qi Xiang, 2002, SPIE Advanced Lithography.

Extremely scaled ultra-thin-body and finfet CMOS devices

Yang-Kyu Choi, Jeffrey Bokor, Shiying Xiong, 2003 .

Extremely scaled silicon nano-CMOS devices

Jeffrey Bokor, Shiying Xiong, Pushkar Ranade, 2003, Proc. IEEE.